DLF 2800

DLF 2800 系统功能强大,可进行高达 2800°C 的精准热扩散系数测量。. << 查看全部闪光导热分析仪 说明特性技术参数Technology性能Software Discovery 激光闪光 DLF 2800 是一款先进的独立仪器,可测量材料的热扩散系数和比热容,温度范围从室温直至 2800°C。其独特设计中包含专属激光器、激光光纤、检测器和加热炉技术,以及独特的六样品位转盘,可提供空前的测量精度和样品处理量。DLF 2800 可在包括惰性气体、真空等各种环境条件下运行,表征各种不同材料的特性,其中包括聚合物、陶瓷、碳、石墨、复合材料、玻璃、金属和合金等。. DLF 2800 特性 功能强大的 DLF 2800 激光器可提供比其他竞争产品高 40% 的能量,从而在最高温度和最广样品范围内实现精确测试,而无需考虑厚度和热传导问题 专有光纤传输管确保 99% 的激光射线均匀传输至样品,可提高测量精度 独特的六样品位转盘有助于大幅提高样品处理速度,并实现精准的热容量测量 转盘设计灵活,可配备多种样品支架、适配器和特定夹具,适用于各类测试 高级加热炉可在室温直至 2800°C 的范围内提供极佳的温度性能,支持在惰性气体或真空环境中应用 高灵敏度红外检测器具备最优信噪比,可在整个温度范围内提供最高精度 实时脉冲映射用于测试薄型和高导热率材料,实现热扩散系数的高精度测量 满足各类行业标准测试方法,包括:ASTM E1461、ASTM C714、ASTM E2585、ISO 13826、ISO 22007 – 第 4 部分、ISO 18755、BS ENV 1159-2、DIN 30905 *美国专利号 #6.375.349.81 激光源 类型 一级钕:玻璃独立式 脉冲能(可变)…

DXF 500

The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 500 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.

DXF 200

The Discovery Xenon Flash DXF 200 employs a High Speed Xenon-pulse Delivery source (HSXD) with considerably lower cost and less maintenance than a laser and generates equivalent results. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 200 produces a pulse width that is shorter (400 μs to 600 μs) than many commercial laser-based systems, while uniformly concentrating sufficient power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.

DLF 1600

Discovery Laser Flash DLF 1600’s source module is a freestanding unit employing a custom Class 1 35 J Nd:Glass laser pulse source. It provides a collimated, monochromatic energy pulse to specimens heated up to the temperature of 1600°C. The laser radiation is delivered via a proprietary fiber optic delivery wand which ensures a 99% homogenized laser pulse. Leading to much more accurate measurements than any direct firing laser pulse instruments. The laser source produces a 300 µs to 400 µs pulse width.

DLF 1200

The Discovery Laser Flash DLF 1200 employs a custom Class 1 Nd:Glass Laser pulse source to provide a collimated, monochromatic energy pulse with a 300 μs to 400 μs pulse width. Ideal for labs that need to measure thermal diffusivity, heat capacity or thermal conductivity at temperatures up to 1200°C, or require the power of a laser in a compact benchtop instrument.

Equipped with a liquid nitrogen-cooled IR detector, DLF 1200 provides high precision, quick response, non-contact measurements in air, inert gas or vacuum to 10-3 torr. Simple to operate and safe to use, easy to maintain and very economical to operate, these systems are suitable for research and development programs, as well as quality control.

DXF 900

The Discovery Xenon Flash (DXF) source module employs a High Speed Xenon-pulse Delivery source (HSXD) which has considerably higher efficiency, lower costs and less maintenance than equivalent systems. A reflective optic configuration of our design effectively harnesses the power of a Xenon flash tube and, with the aid of proprietary wave guides, delivers it to the specimen inside the Environmental Module. DXF 900 produces a pulse width of 400 μs to 600 μs and uniformly concentrates the power from the flash source directly on the entire face of the specimen. Due to this optimized optical arrangement and the broad light spectrum, specimens as large as 25 mm in diameter can be illuminated with sufficient energy to make a high-accuracy measurement. The use of large samples diminishes errors associated with inhomogeneity and permits representative measurements of poorly dispersed composites.